"DISTRIBUTION PROFILES ON THE CRYSTAL STRUCTURE OF THE SURFACE AND AT THE SURFACE OF SILICON DOPED WITH IONS FROM THERMAL ANNEALING OF IRON AND COBALT". JournalNX - A Multidisciplinary Peer Reviewed Journal, [S. l.], p. 420–428, 2021. Disponível em: https://repo.journalnx.com/index.php/nx/article/view/2953. Acesso em: 8 oct. 2025.