"DISTRIBUTION PROFILES ON THE CRYSTAL STRUCTURE OF THE SURFACE AND AT THE SURFACE OF SILICON DOPED WITH IONS FROM THERMAL ANNEALING OF IRON AND COBALT". JournalNX [Internet]. 2021 Apr. 15 [cited 2025 Oct. 8];:420-8. Available from: https://repo.journalnx.com/index.php/nx/article/view/2953