TITANIUM OXIDE AND ITS FEATURES MANIFESTED BY POWDER X-RAY DIFFRACTOMETRY

Abstract

Nanosized titanium dioxide, being a wide-gap semiconductor, has a high potential for use in electronics and electro-optics due to transparency in the visible region of the spectrum and a high refractive index [1-3]. Various peaks in the X-ray phase analysis (XRD) spectrum of titanium oxide TiO2 samples were experimentally detected. The Miller indices and lattice parameters were determined on the basis of XRD data for titanium oxide TiO2 samples obtained for samples with different powder preparation modes. The obtained experimental data are in good agreement with the data obtained by other methods.