ABOUT TESTING DIGITAL DEVICES BY REFERENCE TESTS

Authors

  • I. M. Siddikov Associate Professor of the Kokand State Pedagogical Institute, Candidate of Technical Sciences

DOI:

https://doi.org/10.17605/OSF.IO/38K5E

Keywords:

diagnostics, digital devices, localization

Abstract

The article discusses one of the innovative ways of testing digital devices, the method of reference tests. A mathematical model of the testing process according to the proposed method is described.

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Published

2021-06-21

Issue

Vol. 7 No. 06 (2021): Journal Nx

Section

Articles

License

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

How to Cite

ABOUT TESTING DIGITAL DEVICES BY REFERENCE TESTS. (2021). JournalNX - A Multidisciplinary Peer Reviewed Journal, 7(06), 315-317. https://doi.org/10.17605/OSF.IO/38K5E