TITANIUM OXIDE AND ITS FEATURES MANIFESTED BY POWDER X-RAY DIFFRACTOMETRY

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Published May 23, 2021
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2021: ESLASE

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Sh.T. Khozhiev
Leading Engineer Institute of Bioorganic Chemistry Named after Acad. O.S. Sodykov AN
Kosimov I. O
Leading Engineer Institute of Bioorganic Chemistry Named after Acad. O.S. Sodykov AN
Gaibnazarov B. B.
Institute of Bioorganic Chemistry of the Academy of Sciences of the Republic of Uzbekistan, Tashkent
Bohodirzhonova A. B
Tashkent State Technical University, Tashkent, Universitetskaya st.

Abstract

Nanosized titanium dioxide, being a wide-gap semiconductor, has a high potential for use in electronics and electro-optics due to transparency in the visible region of the spectrum and a high refractive index [1-3]. Various peaks in the X-ray phase analysis (XRD) spectrum of titanium oxide TiO2 samples were experimentally detected. The Miller indices and lattice parameters were determined on the basis of XRD data for titanium oxide TiO2 samples obtained for samples with different powder preparation modes. The obtained experimental data are in good agreement with the data obtained by other methods.

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How to Cite
Sh.T. Khozhiev, Kosimov I. O, Gaibnazarov B. B., & Bohodirzhonova A. B. (2021). TITANIUM OXIDE AND ITS FEATURES MANIFESTED BY POWDER X-RAY DIFFRACTOMETRY. JournalNX - A Multidisciplinary Peer Reviewed Journal, 550–554. Retrieved from https://repo.journalnx.com/index.php/nx/article/view/3265